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AVATAR-MS ADC/DAC Test
AVATAR-MS ADC/DAC Test
Main Features

RF signal source with built-in pre-distortion

Jitter Suppressed Low-Jitter Clocking

RF front-end de-embedding capability

Independent SerDes test capability

Demand consultation
AVATAR-MS ADC/DAC Test
Used for testing high-speed ADC and DAC chips, full-function testing, using DPD, low jitter, de-embedding and other technologies to provide high-precision testing solutions
Demand consultation
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  • 0512-67225004
  • sales@rf-met.com

  • 10th Floor, Building N4, Suzhou 2.5 Industrial Park, Dongchang Road, Suzhou Industrial Park, Suzhou City, Jiangsu Province

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