MET focuses on providing PXI modular measuring instruments and solutions for RF and high-speed testing.

MET's PXI modular measuring instruments include high-speed digital oscilloscopes (DSOs), arbitrary waveform generators (AWGs), vector signal transceivers (VSTs), and analog signal sources (ASGs). We have developed a series of supporting software to optimize user experience, including ScopeWave oscilloscope software, DesignerWave signal generation software, and SageWave vector signal analysis software.

For different application scenarios, MET provides comprehensive test solutions, including dedicated test systems such as high-speed SerDes, ADC/DAC/Transceiver, RF-SOC, and high-speed cables, and corresponding test kits.

MET's products are widely used in mobile communications, wireless LAN, satellite navigation, high-performance computing, and smart cars, and provide key support for semiconductor testing.

Our R&D team continues to explore cutting-edge technologies, develop products with independent intellectual property rights, and provide customers with efficient and accurate test solutions.

MET firmly believes that measurement is cognition and innovation leads the future.