It provides users with powerful and rich measurement and analysis software. In addition to conventional test items such as eye diagrams and BER, the AVARTA-HS machine can also provide some test and analysis capabilities that users are concerned about, such as: jitter injection and jitter decomposition analysis capabilities, support for parameter-configurable CTLE/FFE/DFE error analysis tests, NRZ/PAM4 signal testing through NRZ/PAM4 format data clock recovery, etc. Completely self-developed hardware, software and algorithm IP ensure high-speed test capabilities and provide users with the best test costs.

Typical DUTs include:

Car SerDes chip

MIPI C-PHY/D-PHY/A-PHY

Serializer Chip/Module

Deserializer chip/module

ADAS chips/modules

In-vehicle high-definition transmission mass production board

MWG-242A/B Series PXIe High-Speed Arbitrary Waveform Generator:

Bandwidth ················ 10.5GHz

Resolution ············· 8 bit

Sampling rate ············· 24 Gsa/s

Output Channel ·········· A suffix：2.92mm, 2-CH SE./Diff.

                                                                 B suffix：SMP, 2-CH Diff.

Output amplitude ·········· 100-600 mVp-p
Storage Depth ·········· 416.7ms @24 GSa/s (10Gpts)

MDO-401A/B Series PXIe High-Speed Wideband Digital Oscilloscopes:

Bandwidth ················ 18GHz

Resolution ············· 8 bit

Sampling rate ············· 40 Gsa/s

Input amplitude ·········· 500 mVp-p

Record length ·········· 500ms @40 GSa/s (20Gpts)
Input Channels ·········· A suffix：1 CH 2.92mm Diff.
                          B suffix：1 CH SMP Diff.