“Focus on building the most professional RF chip and high-speed chip testing service platform in Suzhou”

On September 26, the unveiling ceremony was successfully held

        “The unveiling ceremony of the "RF and High-Speed Chip Joint Laboratory" was successfully held in Gusu Laboratory.

The "RF and High-speed Chip Joint Laboratory" is oriented to the field of RF chip and high-speed chip testing, and operates in a multi-party co-construction + sharing mode. Suzhou Laboratory and corporate partners focus on the "key links" of industrial innovation, jointly invest and cooperate for a long time, jointly build a high-level scientific research platform and a high-level scientific research team, and strive to create the most professional RF chip and high-speed chip testing service platform in Suzhou, and build a new ecology of high-quality integration and innovation on this basis.

 At the unveiling ceremony, Dr. Hu Youde, the head of the joint laboratory, introduced the progress of the construction of the joint laboratory. He said that the ultimate goal of the joint laboratory is to transcend the test itself, provide high value-added R&D services, promote the integration of industry, academia, research and application, and seize the high ground of science and technology; the joint laboratory will realize resource integration, sharing and reuse, mutual benefit and reciprocity, and maximize value creation for all participants. The heads of the corporate partners of the joint laboratory (Suzhou Mi Tu Optoelectronics Technology Co., Ltd., Suzhou MET Technology Co., Ltd., Suzhou Zhongke Integrated Circuit Design Center, Beijing Tianyu Testing Technology Co., Ltd., Lichuan (Wuxi) Semiconductor Equipment Co., Ltd., Shenzhen Huace Semiconductor Equipment Co., Ltd.) introduced the relevant situation of the company and scientific research projects.

 Zhang Dongchi, vice chairman of Suzhou CPPCC and director of Gusu Laboratory, unveiled the joint laboratory.

 Xu Wenqing, Secretary of the Party Working Committee of Suzhou Dushu Lake Science and Education Innovation Zone and Executive Deputy Director of Gusu Laboratory, and Shen Dezheng, Chief Scientist of Gusu Laboratory, respectively presented plaques to the first batch of signed cooperation enterprises.

MET Technology Introduction to MET's testing capabilities

MET Technology provides powerful testing capabilities for the "RF and High-Speed Chip Joint Laboratory", including:

METER™ Series PXIe Instruments

• High-speed, high-bandwidth real-time oscilloscope, MDO-401x: 40G sampling rate, 18GHz bandwidth

• High sampling rate arbitrary waveform generator: MWG-241x: 24G sampling rate, 12GHz bandwidth

METER™ Series PXIe Instruments

• Luna-Suite™ High-Speed Interface Test Software

Typical DUTs include:

• Serializer Chip/Module  Serializer

• Deserializer chip/module  Deserializer

• ADAS chips/modules

☆  MIPI C-PHY/D-PHY/A-PHY;

About Us

Insight into the essence of testing with scientific eyes

Provide accurate software/hardware testing solutions and services!

The company's products can be used in the testing of RF wafers/chips/devices/transceiver modules and high-speed transmission interface chips, and are widely used in mobile communications, wireless LAN, satellite navigation, high-performance computing, smart cars, unmanned aerial vehicles, radar, radio and television, radio astronomy and other fields.